diff options
author | Akinobu Mita <akinobu.mita@gmail.com> | 2009-10-22 16:53:33 +0900 |
---|---|---|
committer | David Woodhouse <David.Woodhouse@intel.com> | 2009-11-30 09:41:49 +0000 |
commit | 7126bd8be4ee009c56c4ec037f07f2c0884413fc (patch) | |
tree | 0c453ef8f478f10d70aa5a913a36795244711bfc /drivers/mtd/tests/mtd_nandecctest.c | |
parent | 1c63aca32903efc219fb9df72bae5344f3e54ed5 (diff) |
mtd: add nand_ecc test module
This module tests NAND ECC functions.
The test is simple.
1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Diffstat (limited to 'drivers/mtd/tests/mtd_nandecctest.c')
-rw-r--r-- | drivers/mtd/tests/mtd_nandecctest.c | 87 |
1 files changed, 87 insertions, 0 deletions
diff --git a/drivers/mtd/tests/mtd_nandecctest.c b/drivers/mtd/tests/mtd_nandecctest.c new file mode 100644 index 00000000000..c1f31051784 --- /dev/null +++ b/drivers/mtd/tests/mtd_nandecctest.c @@ -0,0 +1,87 @@ +#include <linux/kernel.h> +#include <linux/module.h> +#include <linux/list.h> +#include <linux/slab.h> +#include <linux/random.h> +#include <linux/string.h> +#include <linux/bitops.h> +#include <linux/jiffies.h> +#include <linux/mtd/nand_ecc.h> + +#if defined(CONFIG_MTD_NAND) || defined(CONFIG_MTD_NAND_MODULE) + +static void inject_single_bit_error(void *data, size_t size) +{ + unsigned long offset = random32() % (size * BITS_PER_BYTE); + + __change_bit(offset, data); +} + +static unsigned char data[512]; +static unsigned char error_data[512]; + +static int nand_ecc_test(const size_t size) +{ + unsigned char code[3]; + unsigned char error_code[3]; + char testname[30]; + + BUG_ON(sizeof(data) < size); + + sprintf(testname, "nand-ecc-%zu", size); + + get_random_bytes(data, size); + + memcpy(error_data, data, size); + inject_single_bit_error(error_data, size); + + __nand_calculate_ecc(data, size, code); + __nand_calculate_ecc(error_data, size, error_code); + __nand_correct_data(error_data, code, error_code, size); + + if (!memcmp(data, error_data, size)) { + printk(KERN_INFO "mtd_nandecctest: ok - %s\n", testname); + return 0; + } + + printk(KERN_ERR "mtd_nandecctest: not ok - %s\n", testname); + + printk(KERN_DEBUG "hexdump of data:\n"); + print_hex_dump(KERN_DEBUG, "", DUMP_PREFIX_OFFSET, 16, 4, + data, size, false); + printk(KERN_DEBUG "hexdump of error data:\n"); + print_hex_dump(KERN_DEBUG, "", DUMP_PREFIX_OFFSET, 16, 4, + error_data, size, false); + + return -1; +} + +#else + +static int nand_ecc_test(const size_t size) +{ + return 0; +} + +#endif + +static int __init ecc_test_init(void) +{ + srandom32(jiffies); + + nand_ecc_test(256); + nand_ecc_test(512); + + return 0; +} + +static void __exit ecc_test_exit(void) +{ +} + +module_init(ecc_test_init); +module_exit(ecc_test_exit); + +MODULE_DESCRIPTION("NAND ECC function test module"); +MODULE_AUTHOR("Akinobu Mita"); +MODULE_LICENSE("GPL"); |