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authorLuo Andy <yifei.luo@intel.com>2010-11-23 10:41:21 +0800
committerGreg Kroah-Hartman <gregkh@suse.de>2010-11-30 16:50:36 -0800
commit7fc56f0d9908fe140a01387d59954e3d0a2e7744 (patch)
tree88cbdeeacff090643c8b2dc6e44df82b2d1f2b6b /include/linux/usb
parentb23f2f94136884ebeb1b5e2196f4a53086444afa (diff)
usb: gadget: langwell_udc: add usb test mode support
This patch adds test mode support for Langwell gadget driver. Signed-off-by: Henry Yuan <hang.yuan@intel.com> Signed-off-by: Andy Luo <yifei.luo@intel.com> Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
Diffstat (limited to 'include/linux/usb')
-rw-r--r--include/linux/usb/ch9.h10
1 files changed, 10 insertions, 0 deletions
diff --git a/include/linux/usb/ch9.h b/include/linux/usb/ch9.h
index f917bbbc890..ab461948b57 100644
--- a/include/linux/usb/ch9.h
+++ b/include/linux/usb/ch9.h
@@ -124,6 +124,16 @@
#define USB_DEVICE_DEBUG_MODE 6 /* (special devices only) */
/*
+ * Test Mode Selectors
+ * See USB 2.0 spec Table 9-7
+ */
+#define TEST_J 1
+#define TEST_K 2
+#define TEST_SE0_NAK 3
+#define TEST_PACKET 4
+#define TEST_FORCE_EN 5
+
+/*
* New Feature Selectors as added by USB 3.0
* See USB 3.0 spec Table 9-6
*/