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-rw-r--r--include/linux/mtd/bbm.h35
-rw-r--r--include/linux/mtd/cfi.h9
-rw-r--r--include/linux/mtd/flashchip.h9
-rw-r--r--include/linux/mtd/nand.h97
-rw-r--r--include/linux/mtd/nand_ecc.h10
-rw-r--r--include/linux/mtd/onenand.h23
-rw-r--r--include/linux/mtd/onenand_regs.h2
7 files changed, 53 insertions, 132 deletions
diff --git a/include/linux/mtd/bbm.h b/include/linux/mtd/bbm.h
index fff8c53e543..9c3757c5759 100644
--- a/include/linux/mtd/bbm.h
+++ b/include/linux/mtd/bbm.h
@@ -19,22 +19,21 @@
/**
* struct nand_bbt_descr - bad block table descriptor
- * @options: options for this descriptor
- * @pages: the page(s) where we find the bbt, used with
- * option BBT_ABSPAGE when bbt is searched,
- * then we store the found bbts pages here.
- * Its an array and supports up to 8 chips now
- * @offs: offset of the pattern in the oob area of the page
- * @veroffs: offset of the bbt version counter in the oob area of the page
- * @version: version read from the bbt page during scan
- * @len: length of the pattern, if 0 no pattern check is performed
- * @maxblocks: maximum number of blocks to search for a bbt. This
- * number of blocks is reserved at the end of the device
- * where the tables are written.
- * @reserved_block_code: if non-0, this pattern denotes a reserved
- * (rather than bad) block in the stored bbt
- * @pattern: pattern to identify bad block table or factory marked
- * good / bad blocks, can be NULL, if len = 0
+ * @options: options for this descriptor
+ * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
+ * when bbt is searched, then we store the found bbts pages here.
+ * Its an array and supports up to 8 chips now
+ * @offs: offset of the pattern in the oob area of the page
+ * @veroffs: offset of the bbt version counter in the oob are of the page
+ * @version: version read from the bbt page during scan
+ * @len: length of the pattern, if 0 no pattern check is performed
+ * @maxblocks: maximum number of blocks to search for a bbt. This number of
+ * blocks is reserved at the end of the device where the tables are
+ * written.
+ * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
+ * bad) block in the stored bbt
+ * @pattern: pattern to identify bad block table or factory marked good /
+ * bad blocks, can be NULL, if len = 0
*
* Descriptor for the bad block table marker and the descriptor for the
* pattern which identifies good and bad blocks. The assumption is made
@@ -90,7 +89,9 @@ struct nand_bbt_descr {
/*
* Constants for oob configuration
*/
-#define ONENAND_BADBLOCK_POS 0
+#define NAND_SMALL_BADBLOCK_POS 5
+#define NAND_LARGE_BADBLOCK_POS 0
+#define ONENAND_BADBLOCK_POS 0
/*
* Bad block scanning errors
diff --git a/include/linux/mtd/cfi.h b/include/linux/mtd/cfi.h
index 88d3d8fbf9f..df89f427523 100644
--- a/include/linux/mtd/cfi.h
+++ b/include/linux/mtd/cfi.h
@@ -518,10 +518,11 @@ struct cfi_fixup {
#define CFI_MFR_ANY 0xffff
#define CFI_ID_ANY 0xffff
-#define CFI_MFR_AMD 0x0001
-#define CFI_MFR_ATMEL 0x001F
-#define CFI_MFR_SAMSUNG 0x00EC
-#define CFI_MFR_ST 0x0020 /* STMicroelectronics */
+#define CFI_MFR_AMD 0x0001
+#define CFI_MFR_INTEL 0x0089
+#define CFI_MFR_ATMEL 0x001F
+#define CFI_MFR_SAMSUNG 0x00EC
+#define CFI_MFR_ST 0x0020 /* STMicroelectronics */
void cfi_fixup(struct mtd_info *mtd, struct cfi_fixup* fixups);
diff --git a/include/linux/mtd/flashchip.h b/include/linux/mtd/flashchip.h
index d4f38c5fd44..d0bf422ae37 100644
--- a/include/linux/mtd/flashchip.h
+++ b/include/linux/mtd/flashchip.h
@@ -38,6 +38,15 @@ typedef enum {
FL_XIP_WHILE_ERASING,
FL_XIP_WHILE_WRITING,
FL_SHUTDOWN,
+ /* These 2 come from nand_state_t, which has been unified here */
+ FL_READING,
+ FL_CACHEDPRG,
+ /* These 4 come from onenand_state_t, which has been unified here */
+ FL_RESETING,
+ FL_OTPING,
+ FL_PREPARING_ERASE,
+ FL_VERIFYING_ERASE,
+
FL_UNKNOWN
} flstate_t;
diff --git a/include/linux/mtd/nand.h b/include/linux/mtd/nand.h
index 7a232a9bdd6..ccab9dfc521 100644
--- a/include/linux/mtd/nand.h
+++ b/include/linux/mtd/nand.h
@@ -21,6 +21,8 @@
#include <linux/wait.h>
#include <linux/spinlock.h>
#include <linux/mtd/mtd.h>
+#include <linux/mtd/flashchip.h>
+#include <linux/mtd/bbm.h>
struct mtd_info;
/* Scan and identify a NAND device */
@@ -168,7 +170,6 @@ typedef enum {
/* Chip does not allow subpage writes */
#define NAND_NO_SUBPAGE_WRITE 0x00000200
-
/* Options valid for Samsung large page devices */
#define NAND_SAMSUNG_LP_OPTIONS \
(NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
@@ -194,6 +195,9 @@ typedef enum {
/* This option is defined if the board driver allocates its own buffers
(e.g. because it needs them DMA-coherent */
#define NAND_OWN_BUFFERS 0x00040000
+/* Chip may not exist, so silence any errors in scan */
+#define NAND_SCAN_SILENT_NODEV 0x00080000
+
/* Options set by nand scan */
/* Nand scan has allocated controller struct */
#define NAND_CONTROLLER_ALLOC 0x80000000
@@ -202,20 +206,6 @@ typedef enum {
#define NAND_CI_CHIPNR_MSK 0x03
#define NAND_CI_CELLTYPE_MSK 0x0C
-/*
- * nand_state_t - chip states
- * Enumeration for NAND flash chip state
- */
-typedef enum {
- FL_READY,
- FL_READING,
- FL_WRITING,
- FL_ERASING,
- FL_SYNCING,
- FL_CACHEDPRG,
- FL_PM_SUSPENDED,
-} nand_state_t;
-
/* Keep gcc happy */
struct nand_chip;
@@ -402,7 +392,7 @@ struct nand_chip {
uint8_t cellinfo;
int badblockpos;
- nand_state_t state;
+ flstate_t state;
uint8_t *oob_poi;
struct nand_hw_control *controller;
@@ -470,75 +460,6 @@ struct nand_manufacturers {
extern struct nand_flash_dev nand_flash_ids[];
extern struct nand_manufacturers nand_manuf_ids[];
-/**
- * struct nand_bbt_descr - bad block table descriptor
- * @options: options for this descriptor
- * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
- * when bbt is searched, then we store the found bbts pages here.
- * Its an array and supports up to 8 chips now
- * @offs: offset of the pattern in the oob area of the page
- * @veroffs: offset of the bbt version counter in the oob are of the page
- * @version: version read from the bbt page during scan
- * @len: length of the pattern, if 0 no pattern check is performed
- * @maxblocks: maximum number of blocks to search for a bbt. This number of
- * blocks is reserved at the end of the device where the tables are
- * written.
- * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
- * bad) block in the stored bbt
- * @pattern: pattern to identify bad block table or factory marked good /
- * bad blocks, can be NULL, if len = 0
- *
- * Descriptor for the bad block table marker and the descriptor for the
- * pattern which identifies good and bad blocks. The assumption is made
- * that the pattern and the version count are always located in the oob area
- * of the first block.
- */
-struct nand_bbt_descr {
- int options;
- int pages[NAND_MAX_CHIPS];
- int offs;
- int veroffs;
- uint8_t version[NAND_MAX_CHIPS];
- int len;
- int maxblocks;
- int reserved_block_code;
- uint8_t *pattern;
-};
-
-/* Options for the bad block table descriptors */
-
-/* The number of bits used per block in the bbt on the device */
-#define NAND_BBT_NRBITS_MSK 0x0000000F
-#define NAND_BBT_1BIT 0x00000001
-#define NAND_BBT_2BIT 0x00000002
-#define NAND_BBT_4BIT 0x00000004
-#define NAND_BBT_8BIT 0x00000008
-/* The bad block table is in the last good block of the device */
-#define NAND_BBT_LASTBLOCK 0x00000010
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_ABSPAGE 0x00000020
-/* The bbt is at the given page, else we must scan for the bbt */
-#define NAND_BBT_SEARCH 0x00000040
-/* bbt is stored per chip on multichip devices */
-#define NAND_BBT_PERCHIP 0x00000080
-/* bbt has a version counter at offset veroffs */
-#define NAND_BBT_VERSION 0x00000100
-/* Create a bbt if none axists */
-#define NAND_BBT_CREATE 0x00000200
-/* Search good / bad pattern through all pages of a block */
-#define NAND_BBT_SCANALLPAGES 0x00000400
-/* Scan block empty during good / bad block scan */
-#define NAND_BBT_SCANEMPTY 0x00000800
-/* Write bbt if neccecary */
-#define NAND_BBT_WRITE 0x00001000
-/* Read and write back block contents when writing bbt */
-#define NAND_BBT_SAVECONTENT 0x00002000
-/* Search good / bad pattern on the first and the second page */
-#define NAND_BBT_SCAN2NDPAGE 0x00004000
-
-/* The maximum number of blocks to scan for a bbt */
-#define NAND_BBT_SCAN_MAXBLOCKS 4
-
extern int nand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int nand_update_bbt(struct mtd_info *mtd, loff_t offs);
extern int nand_default_bbt(struct mtd_info *mtd);
@@ -548,12 +469,6 @@ extern int nand_erase_nand(struct mtd_info *mtd, struct erase_info *instr,
extern int nand_do_read(struct mtd_info *mtd, loff_t from, size_t len,
size_t * retlen, uint8_t * buf);
-/*
-* Constants for oob configuration
-*/
-#define NAND_SMALL_BADBLOCK_POS 5
-#define NAND_LARGE_BADBLOCK_POS 0
-
/**
* struct platform_nand_chip - chip level device structure
* @nr_chips: max. number of chips to scan for
diff --git a/include/linux/mtd/nand_ecc.h b/include/linux/mtd/nand_ecc.h
index 052ea8ca243..41bc013571d 100644
--- a/include/linux/mtd/nand_ecc.h
+++ b/include/linux/mtd/nand_ecc.h
@@ -16,7 +16,13 @@
struct mtd_info;
/*
- * Calculate 3 byte ECC code for 256 byte block
+ * Calculate 3 byte ECC code for eccsize byte block
+ */
+void __nand_calculate_ecc(const u_char *dat, unsigned int eccsize,
+ u_char *ecc_code);
+
+/*
+ * Calculate 3 byte ECC code for 256/512 byte block
*/
int nand_calculate_ecc(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
@@ -27,7 +33,7 @@ int __nand_correct_data(u_char *dat, u_char *read_ecc, u_char *calc_ecc,
unsigned int eccsize);
/*
- * Detect and correct a 1 bit error for 256 byte block
+ * Detect and correct a 1 bit error for 256/512 byte block
*/
int nand_correct_data(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
diff --git a/include/linux/mtd/onenand.h b/include/linux/mtd/onenand.h
index 4e49f335067..5509eb06b32 100644
--- a/include/linux/mtd/onenand.h
+++ b/include/linux/mtd/onenand.h
@@ -1,7 +1,7 @@
/*
* linux/include/linux/mtd/onenand.h
*
- * Copyright (C) 2005-2007 Samsung Electronics
+ * Copyright © 2005-2009 Samsung Electronics
* Kyungmin Park <kyungmin.park@samsung.com>
*
* This program is free software; you can redistribute it and/or modify
@@ -14,6 +14,7 @@
#include <linux/spinlock.h>
#include <linux/completion.h>
+#include <linux/mtd/flashchip.h>
#include <linux/mtd/onenand_regs.h>
#include <linux/mtd/bbm.h>
@@ -25,22 +26,6 @@ extern int onenand_scan(struct mtd_info *mtd, int max_chips);
/* Free resources held by the OneNAND device */
extern void onenand_release(struct mtd_info *mtd);
-/*
- * onenand_state_t - chip states
- * Enumeration for OneNAND flash chip state
- */
-typedef enum {
- FL_READY,
- FL_READING,
- FL_WRITING,
- FL_ERASING,
- FL_SYNCING,
- FL_LOCKING,
- FL_RESETING,
- FL_OTPING,
- FL_PM_SUSPENDED,
-} onenand_state_t;
-
/**
* struct onenand_bufferram - OneNAND BufferRAM Data
* @blockpage: block & page address in BufferRAM
@@ -137,7 +122,7 @@ struct onenand_chip {
spinlock_t chip_lock;
wait_queue_head_t wq;
- onenand_state_t state;
+ flstate_t state;
unsigned char *page_buf;
unsigned char *oob_buf;
@@ -152,6 +137,8 @@ struct onenand_chip {
/*
* Helper macros
*/
+#define ONENAND_PAGES_PER_BLOCK (1<<6)
+
#define ONENAND_CURRENT_BUFFERRAM(this) (this->bufferram_index)
#define ONENAND_NEXT_BUFFERRAM(this) (this->bufferram_index ^ 1)
#define ONENAND_SET_NEXT_BUFFERRAM(this) (this->bufferram_index ^= 1)
diff --git a/include/linux/mtd/onenand_regs.h b/include/linux/mtd/onenand_regs.h
index acadbf53a69..cd6f3b43119 100644
--- a/include/linux/mtd/onenand_regs.h
+++ b/include/linux/mtd/onenand_regs.h
@@ -131,6 +131,8 @@
#define ONENAND_CMD_LOCK_TIGHT (0x2C)
#define ONENAND_CMD_UNLOCK_ALL (0x27)
#define ONENAND_CMD_ERASE (0x94)
+#define ONENAND_CMD_MULTIBLOCK_ERASE (0x95)
+#define ONENAND_CMD_ERASE_VERIFY (0x71)
#define ONENAND_CMD_RESET (0xF0)
#define ONENAND_CMD_OTP_ACCESS (0x65)
#define ONENAND_CMD_READID (0x90)