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2013-12-03iio: Add support for humidity sensorsHarald Geyer
There are already humidity sensors in the hwmon subsystem, so we use their unit (milli percent) here as well. Signed-off-by: Harald Geyer <harald@ccbib.org> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-10-12iio: Add a hysteresis event info attributeLars-Peter Clausen
For some devices it is possible to configure a hysteresis for threshold (or similar) events. This patch adds a new hysteresis event info type which allows for easy creation and read/write handling of the sysfs attribute. Signed-off-by: Lars-Peter Clausen <lars@metafoo.de> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-10-01iio: Update unit of the voltage scale in the documentationLars-Peter Clausen
The documentation says that the result of raw * scale should be in microvolts, but in reallity all drivers actually report the scale so that the result is in millivolts. So update the documentation to match reallity. Signed-off-by: Lars-Peter Clausen <lars@metafoo.de> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-09-14iio: Add INT_TIME (integration time) channel info attributePeter Meerwald
Integration time is in seconds; it controls the measurement time and influences the gain of a sensor. There are two typical ways that scaling is implemented in a device: 1) input amplifier, 2) reference to the ADC is changed. These both result in the accuracy of the ADC varying (by applying its sampling over a more relevant range). Integration time is a way of dealing with noise inherent in the analog sensor itself. In the case of a light sensor, a mixture of photon noise and device specific noise. Photon noise is dealt with by either improving the efficiency of the sensor, (more photons actually captured) which is not easily varied dynamically, or by integrating the measurement over a longer time period. Note that this can also be thought of as an averaging of a number of individual samples and is infact sometimes implemented this way. Altering integration time implies that the duration of a measurement changes, a fact the device's user may be interested in. Hence it makes sense to distinguish between integration time and simple scale. In some devices both types of control are present and whilst they will have similar effects on the amplitude of the reading, their effect on the noise of the measurements will differ considerably. Used by adjd_s311, tsl4531, tcs3472 The following drivers have similar controls (and could be adapted): * tsl2563 (integration time is controlled via CALIBSCALE among other things) * tsl2583 (has integration_time device_attr, but driver doesn't use channels yet) * tsl2x7x (has integration_time attr) Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Cc: Jon Brenner <jon.brenner@ams.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-08-28staging: iio: Documentation sysfs-bus-iio add power_modeOleksandr Kravchenko
Add description about in_accelX_power_mode and in_accel_power_mode_available. Signed-off-by: Oleksandr Kravchenko <o.v.kravchenko@globallogic.com> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-08-03iio: move ABI specification for store_eeprom; is used by ad9523, mcp4725 and ↵Peter Meerwald
ds1077 devices Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Reviewed-by: Lars-Peter Clausen <lars@metafoo.de> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-08-03iio: add DAC 500kohm_to_gnd to possible powerdown_modesPeter Meerwald
Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2013-06-11iio: ABI doc: update scan_elements sysfs pathsAlexandre Relange
update ABI documentation with current paths related to scan_elements folder Paths changed long time ago in commit: 26d25ae3f0d8ffe350aacc75b71198d6b35bd1f4 Signed-off-by: Alexandre Relange <alexandre@relange.org> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2012-11-20iio: Add pressure channel typeLars-Peter Clausen
This patch adds support for a new IIO channel type for pressure measurements. This can for example be used for barometric pressure sensors. Signed-off-by: Lars-Peter Clausen <lars@metafoo.de> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2012-07-08iio: kernel version typo in sysfs-bus-iioPeter Meerwald
Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Signed-off-by: Jonathan Cameron <jic23@kernel.org>
2012-06-15iio: sysfs-bus-iio typoPeter Meerwald
Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Acked-by: Jonathan Cameron <jic23@kernel.org> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2012-06-13Merge branch 'staging-linus' into staging-nextGreg Kroah-Hartman
We need this for the pstore fixes that went into the staging-linus branch, so that things apply properly for the pstore/android code merge. Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2012-06-12iio: nitpicking on sysfs-bus-iioPeter Meerwald
v2: address comments by Jonathan Cameron * add more output power down modes * spelling of etc. Signed-off-by: Peter Meerwald <pmeerw@pmeerw.net> Acked-by: Jonathan Cameron <jic23@kernel.org> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2012-06-04iio: documentation: Add out_altvoltage and friendsMichael Hennerich
Continuous frequency/clock generating devices, such as DDSs or PLLs should use out_altvoltage. Signed-off-by: Michael Hennerich <michael.hennerich@analog.com> Acked-by: Jonathan Cameron <jic23@kernel.org> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2012-05-14iio: core: introduce IIO_CHAN_INFO_HARDWAREGAINMichael Hennerich
Signed-off-by: Michael Hennerich <michael.hennerich@analog.com> Acked-by: Jonathan Cameron <jic23@kernel.org> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
2012-04-25IIO: Move the core abi documentation from stagingJonathan Cameron
This file contains only the most generic elements. Other class specific and device specific ABI documents will follow over time. Signed-off-by: Jonathan Cameron <jic23@kernel.org> Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>