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pattern control
V4L2_CID_TEST_PATTERN is now a standard control.
This patch replaces the user defined control for test
pattern to make use of standard control V4L2_CID_TEST_PATTERN.
Signed-off-by: Lad, Prabhakar <prabhakar.lad@ti.com>
Signed-off-by: Manjunath Hadli <manjunath.hadli@ti.com>
Acked-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
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Compute the horizontal blanking value according to the datasheet. The
value written to the hblank and vblank registers must be equal to the
number of blank columns and rows minus one.
Signed-off-by: Laurent Pinchart <laurent.pinchart@ideasonboard.com>
Acked-by: Sakari Ailus <sakari.ailus@iki.fi>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
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Move ancillary I2C drivers into drivers/media/i2c, in order to
better organize them.
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
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