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path: root/drivers/mtd/tests
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2014-12-12mtd: tests: abort torturetest on erase errorsBrian Norris
The torture test should quit once it actually induces an error in the flash. This step was accidentally removed during refactoring. Without this fix, the torturetest just continues infinitely, or until the maximum cycle count is reached. e.g.: ... [ 7619.218171] mtd_test: error -5 while erasing EB 100 [ 7619.297981] mtd_test: error -5 while erasing EB 100 [ 7619.377953] mtd_test: error -5 while erasing EB 100 [ 7619.457998] mtd_test: error -5 while erasing EB 100 [ 7619.537990] mtd_test: error -5 while erasing EB 100 ... Fixes: 6cf78358c94f ("mtd: mtd_torturetest: use mtd_test helpers") Signed-off-by: Brian Norris <computersforpeace@gmail.com> Cc: Akinobu Mita <akinobu.mita@gmail.com> Cc: <stable@vger.kernel.org>
2014-11-20mtd: oobtest: correct printf() format specifier for 'size_t'Brian Norris
Fixes warning: drivers/mtd/tests/oobtest.c: In function 'memcmpshow': drivers/mtd/tests/oobtest.c:129: warning: format '%x' expects type 'unsigned int', but argument 3 has type 'size_t' Signed-off-by: Brian Norris <computersforpeace@gmail.com> Cc: Roger Quadros <rogerq@ti.com> Cc: Sekhar Nori <nsekhar@ti.com>
2014-11-19mtd: mtd_oobtest: add bitflip_limit parameterRoger Quadros
It is common for NAND devices to have bitflip errors. Add a bitflip_limit parameter to specify how many bitflips per page we can tolerate without flagging an error. By default zero bitflips are tolerated. Signed-off-by: Roger Quadros <rogerq@ti.com> Signed-off-by: Sekhar Nori <nsekhar@ti.com> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2014-11-19mtd: mtd_oobtest: Show the verification error location and dataRoger Quadros
Add a function memcmpshow() that compares the 2 data buffers and shows the address:offset and data bytes on comparison failure. This function does not break at a comparison failure but runs the check for the whole data buffer. Use memcmpshow() instead of memcmp() for all the verification paths. Signed-off-by: Roger Quadros <rogerq@ti.com> Signed-off-by: Sekhar Nori <nsekhar@ti.com> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2014-08-19mtd: tests: fix integer overflow issuesBrian Norris
These multiplications are done with 32-bit arithmetic, then converted to 64-bit. We should widen the integers first to prevent overflow. This could be a problem for large (>4GB) MTD's. Detected by Coverity. Signed-off-by: Brian Norris <computersforpeace@gmail.com> Cc: Akinobu Mita <akinobu.mita@gmail.com>
2014-04-17mtd: mtd_oobtest: generate consistent data for verificationAkinobu Mita
mtd_oobtest writes OOB, read it back and verify. The verification is not correctly done if oobsize is not multiple of 4. Although the data to be written and the data to be compared are generated by several prandom_byte_state() calls starting with the same seed, these two are generated with the different size and different number of calls. Due to the implementation of prandom_byte_state() if the size on each call is not multiple of 4, the resulting data is not always same. This fixes it by just calling prandom_byte_state() once and using correct range instead of calling it multiple times for each. Reported-by: George Cherian <george.cherian@ti.com> Reported-by: Lothar Waßmann <LW@KARO-electronics.de> Tested-by: Lothar Waßmann <LW@KARO-electronics.de> Cc: George Cherian <george.cherian@ti.com> Cc: Lothar Waßmann <LW@KARO-electronics.de> Cc: David Woodhouse <dwmw2@infradead.org> Cc: Lee Jones <lee.jones@linaro.org> Cc: linux-mtd@lists.infradead.org Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2014-03-10mtd: delete non-required instances of include <linux/init.h>Paul Gortmaker
None of these files are actually using any __init type directives and hence don't need to include <linux/init.h>. Most are just a left over from __devinit and __cpuinit removal, or simply due to code getting copied from one driver to the next. Cc: David Woodhouse <dwmw2@infradead.org> Cc: Brian Norris <computersforpeace@gmail.com> Cc: linux-mtd@lists.infradead.org Signed-off-by: Paul Gortmaker <paul.gortmaker@windriver.com> [Brian: dropped one incorrect hunk] Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2014-01-03mtd: tests: mtd_nandecctest: Use IS_ENABLED() macroFabio Estevam
Using the IS_ENABLED() macro can make the code shorter and simpler. Signed-off-by: Fabio Estevam <fabio.estevam@freescale.com> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2013-10-27mtd: nand: add a helper to detect the nand typeHuang Shijie
This helper detects that whether the mtd's type is nand type. Now, it's clear that the MTD_NANDFLASH stands for SLC nand only. So use the mtd_type_is_nand() to replace the old check method to do the nand type (include the SLC and MLC) check. Signed-off-by: Huang Shijie <b32955@freescale.com> Signed-off-by: Brian Norris <computersforpeace@gmail.com>
2013-08-30mtd: tests: incorporate error message for mtdtest_write()Akinobu Mita
All callers of mtdtest_write() print the same error message on failure. This incorporates the error message to mtdtest_write() and removes them from the callers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: tests: incorporate error message for mtdtest_read()Akinobu Mita
All callers of mtdtest_read() print the same error message on failure. This incorporates the error message to mtdtest_read() and removes them from the callers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_nandbiterrs: use mtd_test helpersAkinobu Mita
Use mtdtest_write() and mtdtest_erase_eraseblock() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_torturetest: use mtd_test helpersAkinobu Mita
Use mtdtest_scan_for_bad_eraseblocks() and mtdtest_erase_good_eraseblocks() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_subpagetest: use mtd_test helpersAkinobu Mita
Use mtdtest_scan_for_bad_eraseblocks() and mtdtest_erase_good_eraseblocks() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_stresstest: use mtd_test helpersAkinobu Mita
Use mtdtest_read(), mtdtest_write(), mtdtest_erase_eraseblock(), and mtdtest_scan_for_bad_eraseblocks() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_speedtest: use mtd_test helpersAkinobu Mita
Use mtdtest_write(), mtdtest_read(), mtdtest_scan_for_bad_eraseblocks(), mtdtest_erase_good_eraseblocks() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_readtest: use mtd_test helpersAkinobu Mita
Use mtdtest_read() and mtdtest_scan_for_bad_eraseblocks() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_pagetest: use mtd_test helpersAkinobu Mita
Use mtdtest_write(), mtdtest_read(), mtdtest_erase_eraseblock(), mtdtest_scan_for_bad_eraseblocks(), and mtdtest_erase_good_eraseblocks() in mtd_test helpers. [dwmw2: merge later 'remove always true condition' fix] Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: mtd_oobtest: use mtd_test helpersAkinobu Mita
Use mtdtest_scan_for_bad_eraseblocks(), mtdtest_erase_good_eraseblocks(), and mtdtest_erase_eraseblock() in mtd_test helpers. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: tests: rename sources in order to link a helper objectAkinobu Mita
Each mtd test module have a single source whose name is the same as the module name. In order to link a single object including helper functions to every test module, this rename these sources to the different names. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-30mtd: tests: introduce helper functionsAkinobu Mita
This introduces the helper functions which can be used by several mtd/tests modules. The following three functions are used all over the test modules. - mtdtest_erase_eraseblock() - mtdtest_scan_for_bad_eraseblocks() - mtdtest_erase_good_eraseblocks() The following are wrapper functions for mtd_read() and mtd_write() which can simplify the return value check. - mtdtest_read() - mtdtest_write() All helpers are put into a single .c file and it will be linked to every test module later. The code will actually be copied to every test module, but it is fine for our small test infrastructure. [dwmw2: merge later 'return -EIO when mtdtest_read() failed' fix] Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Brian Norris <computersforpeace@gmail.com> Cc: Vikram Narayanan <vikram186@gmail.com> Cc: Adrian Hunter <adrian.hunter@intel.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-08-05mtd: tests: don't print error messages when out-of-memoryBrian Norris
These strings are now unnecessary and discouraged in the kernel. The kernel will have plenty of big scary messages if kmalloc fails. These now only serve to bloat the module. Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2013-03-02Merge tag 'for-linus-20130301' of git://git.infradead.org/linux-mtdLinus Torvalds
Pull MTD update from David Woodhouse: "Fairly unexciting MTD merge for 3.9: - misc clean-ups in the MTD command-line partitioning parser (cmdlinepart) - add flash locking support for STmicro chips serial flash chips, as well as for CFI command set 2 chips. - new driver for the ELM error correction HW module found in various TI chips, enable the OMAP NAND driver to use the ELM HW error correction - added number of new serial flash IDs - various fixes and improvements in the gpmi NAND driver - bcm47xx NAND driver improvements - make the mtdpart module actually removable" * tag 'for-linus-20130301' of git://git.infradead.org/linux-mtd: (45 commits) mtd: map: BUG() in non handled cases mtd: bcm47xxnflash: use pr_fmt for module prefix in messages mtd: davinci_nand: Use managed resources mtd: mtd_torturetest can cause stack overflows mtd: physmap_of: Convert device allocation to managed devm_kzalloc() mtd: at91: atmel_nand: for PMECC, add code to check the ONFI parameter ECC requirement. mtd: atmel_nand: make pmecc-cap, pmecc-sector-size in dts is optional. mtd: atmel_nand: avoid to report an error when lookup table offset is 0. mtd: bcm47xxsflash: adjust names of bus-specific functions mtd: bcm47xxpart: improve probing of nvram partition mtd: bcm47xxpart: add support for other erase sizes mtd: bcm47xxnflash: register this as normal driver mtd: bcm47xxnflash: fix message mtd: bcm47xxsflash: register this as normal driver mtd: bcm47xxsflash: write number of written bytes mtd: gpmi: add sanity check for the ECC mtd: gpmi: set the Golois Field bit for mx6q's BCH mtd: devices: elm: Removes <xx> literals in elm DT node mtd: gpmi: fix a dereferencing freed memory error mtd: fix the wrong timeo for panic_nand_wait() ...
2013-02-27mtd: mtd_stresstest: use prandom_bytes()Akinobu Mita
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-27mtd: mtd_subpagetest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-27mtd: mtd_speedtest: use prandom_bytesAkinobu Mita
Use prandom_bytes instead of equivalent local function. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-27mtd: mtd_pagetest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-27mtd: mtd_oobtest: convert to use prandom libraryAkinobu Mita
This removes home-brewed pseudo-random number generator and use prandom library. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-27mtd: mtd_nandecctest: use prandom_bytes instead of get_random_bytes()Akinobu Mita
Using prandom_bytes() is enough. Because this data is only used for testing, not used for cryptographic use. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Cc: Artem Bityutskiy <dedekind1@gmail.com> Cc: David Woodhouse <dwmw2@infradead.org> Cc: "Theodore Ts'o" <tytso@mit.edu> Cc: Adrian Hunter <adrian.hunter@intel.com> Cc: David Laight <david.laight@aculab.com> Cc: Eilon Greenstein <eilong@broadcom.com> Cc: Michel Lespinasse <walken@google.com> Cc: Robert Love <robert.w.love@intel.com> Cc: Valdis Kletnieks <valdis.kletnieks@vt.edu> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>
2013-02-13mtd: mtd_torturetest can cause stack overflowsAl Cooper
mtd_torturetest uses the module parm "ebcnt" to control the size of a stack based array of int's. When "ebcnt" is large, Ex: 1000, it causes stack overflows on systems with small kernel stacks. The fix is to move the array from the stack to kmalloc memory. Signed-off-by: Al Cooper <alcooperx@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2013-02-04mtd: rename random32() to prandom_u32()Akinobu Mita
Use more preferable function name which implies using a pseudo-random number generator. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-12-04mtd: tests/read: initialize buffer for whole next pageChristian Herzig
fix: do block-buffer initialize for the whole next page to zero. Signed-off-by: Christian Herzig <christian.herzig@keymile.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-18mtd: Fix typo mtd/testsMasanari Iida
Correct spelling typo in printk within drivers/mtd/tests. Signed-off-by: Masanari Iida <standby24x7@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: mtd_oobtest: printk -> pr_{info,err,crit}Vikram Narayanan
Use pr_info() and pr_err() while defining pr_fmt(). This saves a few characters, joins a few lines, and makes the code a little more readable (and grep-able). Signed-off-by: Brian Norris <computersforpeace@gmail.com> Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_torturetest: Replace printk with pr_{info,crit}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_subpagetest: replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_speedtest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_stresstest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_readtest: Replace printk with pr_{info,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_pagetest: Replace printk with pr_{info,crit,err}Vikram Narayanan
Use pr_fmt instead of PRINT_PREF macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_nandecctest: Use pr_fmt macroVikram Narayanan
Use KBUILD_MODNAME instead of hardcoding the filename Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-11-15mtd: tests: mtd_nandbiterrs: replace msg macro with pr_{info,err}Vikram Narayanan
Use pr_fmt instead of msg macro Signed-off-by: Vikram Narayanan <vikram186@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
2012-09-29mtd: mtd_nandecctest: add double bit error detection testsAkinobu Mita
This adds the double bit error detection test cases listed below: * Prepare data block with double bit error and ECC data without corruption, and verify that the uncorrectable error is detected by __nand_correct_data(). * Prepare data block with single bit error and ECC data with single bit error, and verify that the uncorrectable error is detected. * Prepare data block without corruption and ECC data with double bit error, and verify that the uncorrectable error is detected. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: add single bit error correction testAkinobu Mita
This adds the single bit error correction test case listed below: Prepare data block without corruption and ECC data with single bit error, and verify that the data block is preserved by __nand_correct_data(). Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: add no corruption testAkinobu Mita
This adds no corruptin test case listed below: Prepare data block and ECC data with no corruption, and verify that the data block is preserved by __nand_correct_data() Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: rewrite the test routineAkinobu Mita
This rewrites the entire test routine in order to make it easy to add more tests by later changes and minimize duplication of each tests as much as possible. Now that each test is described by the members of struct nand_ecc_test: - name: descriptive testname - prepare: function to prepare data block and ecc with artifical corruption - verify: function to verify the result of correcting data block Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: support injecting bit error for ecc codeAkinobu Mita
Currently inject_single_bit_error() is used to inject single bit error into randomly selected bit position of the 256 or 512 bytes data block. Later change will add tests which inject bit errors into the ecc code. Unfortunately, inject_single_bit_error() doesn't work for the ecc code which is not a multiple of sizeof(unsigned long). Because bit fliping at random position is done by __change_bit(). For example, flipping bit position 0 by __change_bit(0, addr) modifies 3rd byte (32bit) or 7th byte (64bit) on big-endian systems. Using little-endian version of bitops can fix this issue. But little-endian version of __change_bit is not yet available. So this defines __change_bit_le() locally in a similar fashion to asm-generic/bitops/le.h and use it. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: tests: test for multi-bit error correctionIwo Mergler
This tests ECC biterror recovery on a single NAND page. Mostly intended to test ECC hardware and low-level NAND driver. There are two test modes: 0 - artificially inserting bit errors until the ECC fails This is the default method and fairly quick. It should be independent of the quality of the FLASH. 1 - re-writing the same pattern repeatedly until the ECC fails. This method relies on the physics of NAND FLASH to eventually generate '0' bits if '1' has been written sufficient times. Depending on the NAND, the first bit errors will appear after 1000 or more writes and then will usually snowball, reaching the limits of the ECC quickly. The test stops after 10000 cycles, should your FLASH be exceptionally good and not generate bit errors before that. Try a different page offset in that case. Please note that neither of these tests will significantly 'use up' any FLASH endurance. Only a maximum of two erase operations will be performed. Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: ensure alignment requirement for bitopsAkinobu Mita
Currently the data blocks which is used to test single bit error correction is allocated statically and injecting single bit error is implemented by using __change_bit() which must operate on the memory aligned to the size of an "unsigned long". But there is no such guarantee for statically allocated array. This fix the issue by allocating the data block dynamically by kmalloc(). It also allocate the ecc code dynamically instead of allocating statically on stack. The reason to allocate the ecc code dynamically is that later change will add tests which inject bit errors into the ecc code by bitops. Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
2012-09-29mtd: mtd_nandecctest: improve message outputAkinobu Mita
This includes the message related changes: - Use pr_* instead of printk - Print hexdump of ECC code if test fails - Change log level for hexdump of data from KERN_DEBUG to KERN_INFO - Factor out the hexdump code into a separate function Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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